Sony Unveils Industry-Fastest X-ray CMOS Sensor for Advanced Inspection
Event summary
- Sony Semiconductor Solutions to release IMX711 X-ray CMOS sensor with 26,100 fps imaging speed and 34 e-rms low-noise performance.
- Sensor combines direct conversion charge-integrating technology with proprietary circuit design.
- Mass production begins in Q1 FY2026, targeting inspection and measurement instrumentation markets.
- Developed in collaboration with RIKEN, leveraging pixel structure invented by Dr. Takaki Hatsui.
The big picture
Sony's new sensor addresses critical limitations in X-ray inspection technology, particularly in high-speed and low-flux conditions. This development comes as demand grows for more sophisticated inspection systems in semiconductor and battery manufacturing, where precision and throughput are increasingly important. The collaboration with RIKEN highlights the strategic importance of academic-industry partnerships in advancing sensor technology.
What we're watching
- Market Adoption
- How quickly the IMX711 will be integrated into battery and semiconductor inspection systems.
- Technical Differentiation
- Whether Sony's charge-integrating approach can outperform traditional photon-counting sensors.
- Competitive Response
- The pace at which competitors develop comparable high-speed, low-noise X-ray sensor technology.
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