Advantest Expands V93000 Platform with Pin Scale 5000B for AI/HPC Testing — Advantest America, Inc.

Event summary

Advantest launched Pin Scale 5000B, a digital test solution for its V93000 EXA Scale platform on April 22, 2026.
The new card expands vector memory capacity and optimizes memory usage in chiplet-based architectures.
Pin Scale 5000B supports concurrent testing of multiple IP cores with data rates up to 5 Gbps.
The solution is now ramping with key customers.

The big picture

Advantest's new solution addresses the growing complexity of AI and HPC semiconductors, driven by advanced process nodes and chiplet architectures. The expansion of vector memory and concurrent testing capabilities positions Advantest to capture a larger share of the high-growth semiconductor test market.

What we're watching

Adoption Pace: How quickly key customers integrate Pin Scale 5000B into their AI/HPC testing workflows.
Competitive Response: Whether competitors like Teradyne or Keysight introduce comparable solutions to match Advantest's capabilities.
Scalability Impact: The extent to which Pin Scale 5000B reduces test times and costs for advanced semiconductor devices.