Wooptix’s Phemet® System Promises Precision Boost for Chip Manufacturing

BARCELONA, SPAIN – November 18, 2025 – Wooptix S.L., a semiconductor metrology company, today announced the launch of Phemet®, a novel in-line wafer metrology system designed to dramatically improve process control in advanced semiconductor manufacturing. The system, demonstrated this week at SEMICON Europa, utilizes a unique wavefront phase imaging (WFPI) technology and promises sub-nanometer resolution combined with unprecedented measurement speeds.

Addressing the Need for Precision in a Shrinking World

The demand for increasingly powerful and efficient microchips is driving relentless innovation in semiconductor manufacturing. As devices become smaller and more complex, maintaining precise control over every stage of the fabrication process is paramount. Traditional metrology methods are often reaching their limits in terms of resolution, speed, and ability to monitor critical parameters in real-time. “The industry is facing significant challenges in maintaining yield and defect control as feature sizes shrink,” explains one industry analyst. “New metrology solutions that can provide faster, more accurate measurements are essential.”

Phemet® is designed to meet these challenges. Its WFPI technology captures the complete wave front of light reflected from the wafer surface, creating a high-resolution phase map. This approach allows for precise measurement of wafer topography, flatness, and other critical parameters with sub-nanometer accuracy. The system can capture over 16 million data points per second, enabling full-wafer measurement in a single image – a significant advancement over traditional scanning-based metrology techniques.

WFPI: A New Approach to Wafer Metrology

Wooptix’s WFPI technology differentiates Phemet® from competing systems. Unlike traditional laser interferometry or electron microscopy, WFPI measures the phase of light waves, providing a more comprehensive and accurate representation of the wafer surface. “The key is capturing the complete wavefront,” said one source familiar with the technology. “This allows for a much more detailed and accurate measurement of the wafer’s topography and flatness.”

The benefits of WFPI extend beyond resolution and speed. The technique is non-destructive and can be used to measure a wide range of materials and structures, making it suitable for various semiconductor manufacturing processes, including advanced packaging, 3D integration, and next-generation memory devices. “The versatility of the system is a major advantage,” notes an industry observer. “It can be used to monitor a variety of critical parameters throughout the fabrication process.”

Backed by Industry Leaders

Wooptix has secured over $35 million in funding from prominent investors, including Samsung Venture Investment Corporation, Intel Capital, and TEL Venture Capital, Inc. This strong financial backing underscores the confidence of industry leaders in the company’s technology and its potential to disrupt the semiconductor metrology market. “The level of investment speaks volumes about the potential of this technology,” says one venture capitalist familiar with the company. “These investors are known for their due diligence and their commitment to supporting innovative companies.”

The company’s origins as a spin-off from the University of La Laguna, combined with its experienced team of scientists and engineers, further positions it for success. “They have a strong foundation in optical technology and a deep understanding of the challenges faced by semiconductor manufacturers,” says a source familiar with the company’s research and development efforts.

Implications for Advanced Manufacturing

The launch of Phemet® comes at a critical time for the semiconductor industry. As manufacturers push the boundaries of miniaturization and complexity, the need for precise, high-throughput metrology is becoming increasingly urgent. “The industry is at an inflection point,” explains one analyst. “Traditional metrology methods are simply not adequate for the challenges we face today.”

Phemet® offers a compelling solution to these challenges. By providing sub-nanometer resolution, ultra-fast measurement speeds, and full-wafer imaging, the system enables manufacturers to monitor critical parameters in real-time, optimize process control, and improve yield. The benefits of this technology extend beyond the fabrication facility. More accurate and reliable chips can lead to more efficient and powerful electronic devices, ultimately benefiting consumers and driving innovation across a wide range of industries.

The company anticipates shipping Phemet® to key customers for high-volume manufacturing in the near future. The system is expected to play a significant role in enabling the next generation of semiconductor devices and driving innovation in the years to come.